Ficha Técnica
- ISBN: 9781107076570
- Autor: Chris Jacobsen
- Editorial: Cambridge University Press
- Páginas: No especificado
- Encuadernación: Tapa Dura
- Dimensiones: 170.00 x 244.00 mm
Si te intereso este libro, te recomendamos:
- > Reflection Electron Microscopy and Spectroscopy for Surface Analysis
- > The Principles and Practice of Electron Microscopy
- > Characterization of High Tc Materials and Devices by Electron Microscopy
- > Reflection Electron Microscopy and Spectroscopy for Surface Analysis
- > Characterization of High Tc Materials and Devices by Electron Microscopy
| isbn | 9781107076570 |
|---|---|
| Categories | Tecnología, Ingeniería Y Procesos Industriales |
| Author | Chris Jacobsen |
| Editorial | Cambridge University Press |
| Language | INGLES |
| Edition | 1 |
| Fecha public | 2020 |
| Page Number | 594 |
| ancho_mm | 170 |
| Acabado | Tapa Dura |
