Tecnología, Ingeniería Y Procesos Industriales
Materials and Devices for End-Of-Roadmap and Beyond CMOS Scaling
43,53 €
Volume 1252
Ficha Técnica
- ISBN: 9781107407985
- Autor: Desconocido
- Editorial: Cambridge University Press
- Páginas: No especificado
- Encuadernación: Tapa Dura
- Dimensiones: 152.00 x 229.00 mm
Si te intereso este libro, te recomendamos:
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- > Characterization of High Tc Materials and Devices by Electron Microscopy
- > Characterization of High Tc Materials and Devices by Electron Microscopy
| isbn | 9781107407985 |
|---|---|
| Categories | Tecnología, Ingeniería Y Procesos Industriales |
| Editorial | Cambridge University Press |
| Language | INGLES |
| Edition | 1 |
| Fecha public | 2014 |
| Page Number | 162 |
| ancho_mm | 152 |
| Acabado | Tapa Blanda |
