Tecnología, Ingeniería Y Procesos Industriales
CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications
43,39 €
Volume 1155
Ficha Técnica
- ISBN: 9781107408326
- Autor: Desconocido
- Editorial: Cambridge University Press
- Páginas: No especificado
- Encuadernación: Tapa Dura
- Dimensiones: 152.00 x 229.00 mm
Si te intereso este libro, te recomendamos:
- > CMOS Gate-Stack Scaling – Materials, Interfaces and Reliability Implications
- > Materials and Devices for End-of-Roadmap and Beyond CMOS Scaling
- > Materials and Devices for End-Of-Roadmap and Beyond CMOS Scaling
- > Materials and Strategies for Lab-on-a-Chip – Biological Anaylsis, Cell-Material Interfaces and Fluidic Assembly of Nanostructures
- > Materials and Strategies for Lab-On-A-Chip Biological Analysis, Cell-Material Interfaces and Fluidic Assembly of Nanostructures
| isbn | 9781107408326 |
|---|---|
| Categories | Tecnología, Ingeniería Y Procesos Industriales |
| Editorial | Cambridge University Press |
| Language | INGLES |
| Edition | 1 |
| Fecha public | 2014 |
| Page Number | 194 |
| ancho_mm | 152 |
| Acabado | Tapa Blanda |
